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Title | LayTec |
Description | LayTec – integrated metrology for advanced LayTec is a major provider of integrated metrology for thin-film deposition and other high value generating processes. LayTec’s equipment is used in a broad range of applications like optoelectronics, electronics, PV, displays, optics and photonics, |
Keywords | integrated metrology, in-situ metrology, in-line metrology, lab-line metrology, map-line metrology, thin-film deposition, real-time process monitoring, process optimization, epitaxial process optimization, yield improvement, compound semiconductors |
WebSite | laytec.de |
Host IP | 46.30.60.137 |
Location | Germany |
Site | Rank |
latexbuch.de | 559,178 |
Euro€6,612
Zuletzt aktualisiert: 2022-09-05 00:28:31
laytec.de hat Semrush globalen Rang von 4,185,748. laytec.de hat einen geschätzten Wert von € 6,612, basierend auf seinen geschätzten Werbeeinnahmen. laytec.de empfängt jeden Tag ungefähr 551 einzelne Besucher. Sein Webserver befindet sich in Germany mit der IP-Adresse 46.30.60.137. Laut SiteAdvisor ist laytec.de sicher zu besuchen. |
Kauf-/Verkaufswert | Euro€6,612 |
Tägliche Werbeeinnahmen | Euro€188,993 |
Monatlicher Anzeigenumsatz | Euro€63,365 |
Jährliche Werbeeinnahmen | Euro€4,408 |
Tägliche eindeutige Besucher | 551 |
Hinweis: Alle Traffic- und Einnahmenwerte sind Schätzungen. |
Host | Type | TTL | Data |
laytec.de. | A | 10800 | IP: 46.30.60.137 |
laytec.de. | NS | 10800 | NS Record: ns01.agenturserver.co. |
laytec.de. | NS | 10800 | NS Record: ns01.agenturserver.it. |
laytec.de. | NS | 10800 | NS Record: ns01.agenturserver.de. |
laytec.de. | MX | 10800 | MX Record: 10 webmail.laytec.de. |
laytec.de. | TXT | 10800 | TXT Record: MS=ms33552055 |
laytec.de. | TXT | 10800 | TXT Record: v=spf1 include:agenturserver.de mx ip4:145.253.105.0/29 -all |
Search for: language English 한국어 日本語 简体中文 繁體中文 Sign in Newsletter Contact LayTec > Home Home Solutions Industries Optoelectronics VCSEL UV LEDs Quantum cascade lasers (QCL) Electronics Power and RF Electronics Photovoltaics c-Si c-Si back end CIGS CdTe CPV Perovskites Displays Others Processes Epitaxy IR pyrometry 3 wavelength reflectance In-situ wafer bow UV pyrometry Reflectance Anisotropy Spectroscopy ALD Sputter deposition Roll-to-roll CBD Materials III-Nitride based III-Nitride growth on silicon (Gan/Si) InP based GaAs based PSS Solar Cell Materials Advanced R&D Products In-situ Metrology EpiTT EpiCurve® TT Spectral Systems Pyro 400 AbsoluT NEPtune InspiRe EpiRAS In-line Metrology ILMetro X Link PearL & t-PearL EddyCus Flames At-line Metrology EpiX X Link off-line Software Solutions OEM Solutions Key Technologies Metrology Methods 3λ reflectance Spectroscopic R&T IR Pyrometry UV Pyrometry Deflectometry/Curvature measurement Photoluminescence Conductivity Reflectance Anisotropy |
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